Join the conversation: Materials science and electron microscopy
Whether you’re exploring alternative energy sources, developing stronger, lighter materials, or creating sophisticated nanodevices, electron microscopy, spectroscopy, and microanalysis can provide insight at all scales and modalities to support your materials science research.
No matter your goal, our variety of informational and educational resources on electron microscopy can help you reach your goals.
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This downloadable booklet offers an introduction into the history, technology, and instrumentation that make up electron microscopy. Learn how electron and ion beam microscopes work, the results they can produce, and how researchers and scientists are using this data to address some of the greatest challenges of our time.
Nanoparticles are utilized to improve product or process performance in an increasing number of industries, including catalysts for chemical reactions and high-strength alloys. As these particles may be smaller than 10 nm, a transmission electron microscope is required to resolve the fine particle details. Adding to the challenge, these particles may be made up of multiple compounds that are important to distinguish.
From the food we eat to the cars we drive and the bridges and streets we travel on, a surprising amount of daily life has been impacted by electron microscopy. EM is not only a critical tool for quality control and assurance, but it’s also driving the development of next-generation building materials and life-saving drugs. Explore this interactive diorama to see even more examples of how electron microscopy is a cornerstone of our modern world.
Scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDX) are complimentary techniques that allow you to characterize the structural and chemical composition of materials down to the atom. Join our two-part webinar to learn about the latest advances in STEM and EDX that have enabled the analysis of the widest range of materials to date, including challenging samples such as beam-sensitive materials.