In part one, we will introduce a new (S)TEM platform from Thermo Fisher Scientific that is ideally suited for the analysis of beam-sensitive materials. Learn how this instrument can:
- Mitigate damage in beam sensitive specimens by switching between different accelerating voltages (between 30 and 300 kV) in a single microscopy session
- Accommodate a radically different EDX concept that significantly broadens the range of materials that can be analyzed with STEM-EDX
In part two,Nestor Zaluzec, Senior Scientist, Educator and Inventor at the U.S. Department of Energy’s Argonne National Laboratorywill describe his own role in the development of X-ray detection technology, and how X-ray hyperspectral analysis can ultimately improve the quality of data that can be extracted from materials.