Iliad Scanning Transmission Electron Microscope resources
Welcome to the Iliad resource page, your hub for accessing valuable assets, in-depth information, and comprehensive learning materials about the groundbreaking Iliad (S)TEM. Here, you can download a range of assets including ebook, datasheets, and more, providing you with a comprehensive understanding of the technology and its applications. Whether you are a researcher, scientist, or industry professional, this page serves as a valuable resource to explore the versatility and cutting-edge capabilities of the Iliad instrument. Dive into the wealth of knowledge available here and unlock new insights into the world of analytical science with Iliad (S)TEM.
Iliad (S)TEM technical resources
Iliad scanning transmission electron microscopy publications
Multimodal EELS and EDX spectroscopy in 2D and 3D for analysis of catalysts at the nanoscale
Surface reduction in Cu:CeOx evidenced by EELS: Color map of Cu:CeOx nanoparticles with Ce3+ shown in green and Ce4+ shown in red together with the corresponding spectra extracted from the Ce3+ and Ce4+ regions.
This comprehensive research, performed by Maria Meledina, Dileep Krishnan, Cigdem Ozsoy-Keskinbora, Hamed Heidari, Xiaochao Wu, Ulrich Simon, Sorin Lazar, Peter Tiemeijer, and Paolo Longo, explores the use of advanced 2D and 3D multimodal spectroscopic techniques for understanding the structure of Cu-doped ceria catalysts at the nanoscale, which are widely relevant in catalysis applications.
Quasi-instantaneous ELNES mapping of multi-element compounds
2D map converted into a line map where the low loss and different fine structures are shown across the interface. The information from the different ELNES can be correlated since they are acquired quasi-instantaneously.
This study by Daen Jannis, Nicolas Gauquelin, Maria Meledina, Yuchen Zhao, Yunzhong Chen, and Jo Verbeeck presents a novel method to overcome the challenges of simultaneous ELNES mapping of multiple elements in heterogenic compounds. Using an elegant approach that employs any number of offsets without adding overhead on the dead time of the detector, the team successfully achieved easy correlation of different ELNES and low loss structures.
EELS at very high energy losses: an opportunity to provide complementary information to x-ray absorption spectroscopy (XAS)
Background subtracted EELS spectrum of copper foil revealing the ELNES and EXELFS structures of the Cu_K edge at 8.9789 keV.
This study by Sorin Lazar, Maria Meledina, Claudia Schnohr, Thomas Hoeche, Peter Tiemeijer, Paolo Longo, and Bert Freitag presents a quantitative comparison of X-ray absorption spectra with ELNES and EXELFS at energies at 9 keV. The study showcases how EELS can be used to study structure and property relationships and demonstrates the superior performance of a new experimental setup, which allows for high energy resolution and high collection efficiency while minimizing acquisition time.
Convexity constraints on linear background models for electron energy-loss spectra
Simulated carbon spectrum. The background is extracted from between 400 eV and 1400 eV.
This research paper by Wouter Van den Broek, Daen Jannis, and Jo Verbeeck presents a new linear background model for electron energy loss spectra. The model, which employs convexity constraints, is shown to provide a better description of both simulated and real measurements than the conventional power-law model, especially for wide energy ranges. This development improves elemental quantification results and offers a fast linear fit with a guaranteed unique solution, reducing the need for user input.
Advancing EELS into an unsupervised quantification method
This study by Jo Verbeeck, Daen Jannis, Wouter Van den Broek, Arno Annys, Zezhong Zhang, and Sandra Van Aert focuses on the development of a completely autonomous data processing workflow for electron energy loss spectroscopy. The authors propose improvements to the physical model and background modelling process and introduce automated feature detection to identify elements in a given dataset. This approach results in a more precise, accurate, and user-friendly method for quantifying EELS spectra. This innovative approach not only enhances the reliability of EELS data processing but also broadens its application scope, making it an essential analytical tool even for non-expert users.
For Research Use Only. Not for use in diagnostic procedures.