Meridian EX Semiconductor Fault Isolation System webinar overview
The new Thermo Scientific Meridian EX System introduces a new era of advanced semiconductor fault isolation by using cutting-edge electron beam technology to probe the device under test with a much finer resolution.
Watch this webinar to learn how the Meridian EX System:
- Helps you achieve a 10× spatial resolution improvement versus commercially available optical laser-based fault isolation solutions.
- Eliminates “crosstalk” from adjacent circuits to deliver more reliable characterization data.
- Enables you to capture dynamic data off metal interconnects, such as power distribution layers, which optical fault isolations systems cannot.
About the speaker
Neel Leslie, Product Marketing Manager, Thermo Fisher Scientific
Neel Leslie graduated from San Jose State University with a BS in Chemistry. He joined DCG Systems as a development engineer and later moved to Applications. He eventually managed an Applications Engineering team responsible for circuit edit, nanoprobing, optical fault isolation, and lock-in thermography products. He is currently the product marketing manager in charge of the E-beam probing systems at Thermo Fisher Scientific, where he has worked for over 10 years.