Analytical characterization of light elements, like lithium, is exceedingly challenging, if not impossible, using common techniques such as energy-dispersive X-ray spectroscopy (EDS). This is also true for high-resolution material analysis of samples with very low elemental concentrations. A SIMS (secondary ion mass spectrometry) detector enables sensitive surface analysis for many industrial and research applications. The technique provides detailed elemental and isotopic information about the sample and is capable of depth profiling analysis.
Secondary ion mass spectroscopy (SIMS) is possible on DualBeam (FIB-SEM) tools as ionized particles are generated by the FIB milling process; because these particles come from a very shallow depth it is considered a surface analysis technique. Modern SIMS detectors are compact and well suited for measuring all elements of the periodic table as well as their various isotopes. The key benefits of added SIMS analysis on FIB-SEM instrumentation include:
3D SIMS technology integrates TOF-SIMS detectors into our Auto Slice & View 5 Software, providing an automated and seamless approach to multi-modal, large-volume data collection. This innovation marks a significant advancement in SIMS capabilities, offering numerous benefits:
Automated large volume SIMS analysis
Achieve detailed and extensive analysis with fewer artifacts, enhancing data accuracy and reliability.
3D SIMS imaging of uneven surfaces
Particularly beneficial for analyzing particle materials, such as battery electrodes, enabling comprehensive characterization.
Optimized geometry for SIMS
Automated functions and image matching for pre-alignment before capturing 3D SIMS data, along with stage rotation and tilting at optimized positions to ensure precision.
Seamless operation
SIMS data acquisition is fully integrated into Auto Slice & View 5 Software, ensuring a smooth and efficient user experience.
With these advancements, 3D SIMS offers outstanding capabilities for researchers and industry professionals, enabling more detailed and accurate analysis of complex materials.
Watch our recorded webinar to learn about the integration of a ToF-SIMS detector on a DualBeam system and discover its applications for materials science research using Ga+ FIB or multi-ion species Plasma FIB (Xe+, Ar+, O+).
Watch our recorded webinar to learn about the integration of a ToF-SIMS detector on a DualBeam system and discover its applications for materials science research using Ga+ FIB or multi-ion species Plasma FIB (Xe+, Ar+, O+).
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.
Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.
Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.
Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.
As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.
Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.
Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
