Download the White Paper: The Surface Analysis Toolbox

Download the White Paper: Helical Scanning with Iterative Reconstruction Technology

Download the White Paper: The Surface Analysis Toolbox

Explore the fusion of surface-sensitive techniques for comprehensive sample understanding.

X-ray photoelectron spectroscopy (XPS) is a very powerful technique for analyzing the elemental and chemical state composition of surfaces. However, there may still be information you require that XPS cannot provide. On Thermo Scientific™ surface analysis systems (Nexsa System and ESCALAB Xi+ XPS Microprobe), it is possible to combine XPS with one or more complementary analysis techniques on a single platform.

Download this white paper to learn how:

You can choose the right combination of multiple surface analysis techniques to meet your need to detect additional information on top of XPS.
The Nexsa System can combine XPS with Raman and reflection electron loss spectroscopy (REELS) to more fully characterize graphene for chemical bonding states, defects, and electronic structure.
The ESCALAB Xi+ XPS Microprobe allows you to configure Auger for smaller features to be analyzed than is possible with XPS alone.

*Required field

First Name

Last Name

Company

I would like to:

Speak to a representative

Schedule a demo

Request a quote

Speak to a service representative about our service offerings

Learn more information as a student

Tell us more about your interest timeline:

0–3 months

4–12 months

12+ months

Address 1

Address 2

Business Phone

City

Zip/Postal Code

Comments

To ensure that we are complying with your preferences, we need to confirm permission to send you communications by email.

Email Permission

Please confirm you would like to receive marketing and promotional email messages about Thermo Fisher Scientific products and services.

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.