In this on-demand demonstration, we show how to analyze the crystallinity of silicon through Raman spectroscopy on the Thermo Scientific DXR3 Flex Raman Spectrometer. You can learn why this non-contact, high resolution technique is an ideal tool in the identification, analysis and quantification of crystalline materials.
Who should watch?
- Researchers and scientists interested in semiconducting materials
- Scientists interested in monitoring varying degrees of crystallinity
- Researchers in semiconductor, geology, and graphitic structure industries
About the speaker
Dr. Matt Gabel
Dr. Matt Gabel is a Raman Application Scientist at Thermo Fisher Scientific. He graduated from Washington State University with a Ph.D. in physics, studying the ferroelectric properties of semiconductors. He became deeply involved in vibrational spectroscopy while working as a visiting researcher at Pacific Northwest National Laboratory studying semiconductors with tip-enhanced Raman spectroscopy.