ESD Semiconductor Qualification
Every electrostatic discharge (ESD) control plan is required to identify devices that are sensitive to ESD. We offer a complete suite of test systems to help with your device qualification requirements.
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IC designers and QA program managers in manufacturing and test house facilities worldwide have embraced the Thermo Scientific MK.4, a versatile, powerful, and flexible, high yield test system. Easily upgradeable, the MK.4 is fully capable of taking your test operations through ever evolving regulatory and quality standards. The advanced rapid relay-based (modular matrix) hardware of the MK.4 is on average ten times faster than mechanically driven ESD testers. The switching matrix, while providing consistent ESD paths, also allows any pin to be grounded, floated, vectored or connected to any of the installed V/I supplies. Furthermore, advanced algorithms ensure accurate switching of HV, in support of pulse source technology, per recent JEDEC/ESDA trailing pulse standards. A powerful, extraordinarily fast embedded VME controller drives the highest Speed-of-Test execution available. Data transfer between the embedded controller and the testers PC server, is handled through TCP/IP communication protocols, minimizing data transfer time. The testers PC server can be accessed through internal networks, as well as through the Internet, allowing remote access to the system to determine the systems status or to gather result information.
Rapid-relay-based operations
Rapid-relay-based operations—up to 2304 channels.
Easy-to-use testing operations
Solid state matrix topology for rapid, easy-to-use testing operations.
Latch-Up stimulus and device biasing
Latch-Up stimulus and device biasing.
Excellent pulse source performance
High voltage power source chassis with patented HV isolation enables excellent pulse source performance.
Advanced device preconditioning
Fully compliant JESD78 latch-up testing allows high voltage/high current stressing to esure a robust design.
Remarkable test and throughput speeds
Massive parallelism drives remarkable test and throughput speeds.
Smaller, faster and smarter devices
Addresses global testing demands for today's modern designs and advanced packaging.
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100W V/I Performance Thermo Scientific MK.4TE: eight-V/I configuration.
Powerful V/Is can deliver a total of 800 W to the DUT, enabling complex testing
of all advanced high power processors on your product roadmap.
Solid state matrix topology - for rapid, easy-to-use testing operations. Design
ensures waveform integrity and reproducibility.
100W V/I Performance Thermo Scientific MK.4TE: eight-V/I configuration.
Powerful V/Is can deliver a total of 800 W to the DUT, enabling complex testing
of all advanced high power processors on your product roadmap.
Solid state matrix topology - for rapid, easy-to-use testing operations. Design
ensures waveform integrity and reproducibility.
ESD Semiconductor Qualification
ESD Compliance Testing
Electrostatic discharge (ESD) can damage small features and structures in semiconductors and integrated circuits. We offer a comprehensive suite of test equipment which verifies that your devices meet targeted ESD compliance standards.
ESD Compliance Testing
Electrostatic discharge (ESD) can damage small features and structures in semiconductors and integrated circuits. We offer a comprehensive suite of test equipment which verifies that your devices meet targeted ESD compliance standards.
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Electron microscopy services for
semiconductors
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
Electron microscopy support and resources
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