Manual sampling can introduce errors. Instrument misalignments can impact cut placement accuracy. Producing ultra-thin samples on sub 3 nm nodes can be a highly complicated process. All of this can add up to slower sample turnaround and lost productivity.
Thermo Fisher Scientific’s newest full-wafer DualBeam system uses machine learning and automation to produce wafer-based TEM samples with unprecedented placement control —accelerating time-to-data and improving time-to-yield for the latest generation of advanced logic devices.
What you will learn in this webinar
Who should attend this webinar
This webinar is for failure analysis managers, technicians evaluating process maturity, and anyone who needs fast, accurate wafer-based sample prep for TEM imaging.
SPARK is a knowledge community where semiconductor professionals, researchers, and thought leaders can provide their perspective on tool performance and best practices, access semiconductor and microelectronics insights, and gain visibility into state-of-the-art solutions.
JJ Blackwood, TEM Sample Preparation Product Line Manager, Thermo Fisher Scientific
JJ Blackwood is the TEM Sample Preparation Product Line Manager for the Semiconductor Business unit at Thermo Fisher Scientific. JJ has been with Thermo Fisher for 16 years, starting as an application engineer. His current responsibilities include development of scalable TEM preparation solutions for the next generation of semiconductor devices. JJ holds a BS in Physics from Linfield University.
