Demand for high-performance power MOSFETs is growing as manufacturers of consumer electronics, electric vehicles, and many other devices require improved power management solutions. Higher voltages and frequencies, and integrating new materials into existing processes can bring new product quality and reliability challenges.
To address these challenges, power device vendors need tools that quickly provide fault localization information to improve product quality and reliability.
Introducing an EFA to PFA Workflow for Power MOSFETs
Watch our on-demand webinar to learn how a new electrical failure analysis (EFA) to physical failure analysis (PFA) workflow can help you precisely identify the location of defects and take quick action to minimize yield issues.
You will learn:
- About an EFA to PFA workflow designed for power MOSFETs fault analysis.
- How a Thermo Fisher Scientific customer applied this workflow.
- How localizing faults at the nanoscale can help you increase accuracy and accelerate defect analysis.
Who should attend?
Failure analysis engineers, facilities managers, and fab managers in the semiconductor industry.
About SPARK:
Save time, save money, and stay on top of semiconductor technology advancement at SPARK, a knowledge platform from Thermo Fisher Scientific.
SPARK is a collaborative space where industry thought leaders provide their perspective on tool performance and best practices. SPARK establishes a community for professionals who want to easily access actionable semiconductor and microelectronics insights, and gain visibility to state-of-the-art solutions. This includes the latest updates on Thermo Fisher Scientific’s semiconductor products and workflows.