Scanning Electron Microscopes
Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science to forensics to industrial manufacturing. As soon as microscopic information about the surface or near-surface region of a specimen is needed, SEM becomes a necessary tool. For that reason, the method finds applications in nearly every branch of science, technology, and industry.